Annealed Gallium-Doped Zinc Oxide (ZnO:Ga) Thin Films for Sub-ppm NO2 Sensing - Equipe MICrosystèmes d'Analyse
Article Dans Une Revue PROCEEDINGS Année : 2024

Annealed Gallium-Doped Zinc Oxide (ZnO:Ga) Thin Films for Sub-ppm NO2 Sensing

Résumé

In this work, gallium-doped zinc oxide was deposited with a Radio Frequency Magnetron sputtering method on test platforms. The NO 2 sensing properties of the resulting devices were studied. The sensing properties of ZnO:Ga thin films were successfully stabilized through annealing in dry air, and then improved by either a thinning of the layer or an increase in the roughness of the substrate. The sensing response with an Rgas/Rair of 15 for 100 ppb of NO 2 under 50% humidity was obtained, with a response time below 10 min.

Domaines

Matériaux
Fichier principal
Vignette du fichier
proceedings-97-00061.pdf (2.39 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-04796318 , version 1 (21-11-2024)

Identifiants

Citer

Benjamin Paret, Philippe Menini, Thierry Camps, Yohann Thimont, Antoine Barnabé, et al.. Annealed Gallium-Doped Zinc Oxide (ZnO:Ga) Thin Films for Sub-ppm NO2 Sensing. PROCEEDINGS, 2024, 97, pp.61. ⟨10.3390/proceedings2024097061⟩. ⟨hal-04796318⟩
0 Consultations
0 Téléchargements

Altmetric

Partager

More